MANUFACTURER OF PRECISION TEST EQUIPMENTS FOR

 

SIR, MIR, CAF, SOLDER JOINT RELIABILITY, EVENT DETECTOR and CMS


 
 

Surface Insulation Resistance Test System (SIRTS)

SIRTS is a new patented SIR/MIR, Conductive Anodic Filament (CAF) Resistance and electrochemical migration test system. The engineers at ASR Instruments have been working with leading OEMs and the IPC SIR working committee to develop a test system that meets the latest test requirements.

Meets & Exceeds the requirements for:

  • Hewlett Packard's EL-EN861-00 (ECM) Test
  • ANSI/IPC-JSTD001C (assembly requirements)
  • IPC-TM-650
  • IPC-TM-650 2.6.25 Conductive Anodic Filament [CAF] Test
  • IEC 61189-5 (process characterization)
  • ISO 9455-17
  • BELLCORE TR-NWT-000078
  • DIN GERMAN & JIS JAPANESE STANDARDS
  • IPC-JSTD-004 (solder flux characterization)
  • IPC-SM-840 (solder mask)
  • IPC-CC-830 & IEC 1086 (conformal coatings)

Specifications: 

  • Capacity .................................. 8 to 256
  •  
  • Test Coupons Scan Time .......... < 5 minutes
  •  
  • Measurement Range .................1E6 to 1E13 Ohms
  •  
  • Accuracy ................................. 5 %
  •  
  • Bias Voltage ............................ 0 to +/- 200 VDC Programmable, 0 to +/- 500V Optional
  •  
  • Test Voltage ............................ 0 to +/- 200 VDC Programmable, 0 to +/- 500V Optional
  •  
  • Software ................................. Windows 7, XP , VISTA
  •  
  • Calibration .............................. Auto-calibration
  •  
  • Current Limiting....................... 1 M Ohm on every channel
  •  
  • Type of Coupon ....................... IPC B24, B25, B25A, B36, B52, or Custom test coupon
  •  
  • Power .................................... Chamber humidity and temperature monitoring and graphing
   

System Description:

ASR Instruments patented method sets a new standard for measuring SIR better than any of the existing systems on the market. The system uses a unique method of employing solid state switches instead of reed relays used in traditional systems. This eliminates leakage associated with systems using switching relays, enhances system reliability and accuracy. The scan time for 256 channels is reduced from several hours to less than 5 minutes.

  • Built-in and programmable IPC and other Standard Test Profiles
  • Programmable Test Interval
  • Real Time data display and graphs
  • Optional plug-in Test Racks including Teflon wiring

SIRTS design specifications reflect customer requests and requirements. State-of-the-art engineering and manufacturing ensure that it will perform reliably in a variety of environments.

 

 
 


 


TEFLON CABLE HARNESS

 

 
   
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